SAE J2052_201101 PDF
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Test Device Head Contact Duration Analysis
Description
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
History
| J2052_201607 | 2016-07-12 | Latest | Stabilized |
| J2052_201101 | 2011-01-05 | Historical | Revised |
| J2052_200512 | 2005-12-14 | Historical | Reaffirmed |
| J2052_199712 | 1997-12-01 | Historical | Revised |
| J2052_199003 | 1990-03-01 | Historical | Issued |
| ISSUING COMMITTEE | Safety Test Instrumentation Standards Committee |
|---|---|
| DATE | 2011-01-05 |
| DOI | |
| ISCURRENT | |
| PAGE | 6 |
| PUBLISHER | SAE International |
| REVISED | REVISED |
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