SAE J784A_197108 PDF

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Residual Stress Measurement by X-Ray Diffraction

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Description

Residual Stress Measurement by X-Ray Diffraction

History

J784A_197108 1971-08-01 Latest Revised
J784 1971-08-01 Historical
ISSUING COMMITTEE
DATE

1971-08-01

DOI

https://doi.org/10.4271/J784A_197108

ISCURRENT

Current

PAGE
PUBLISHER

124

REVISED

REVISED

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SAE J784A_197108 PDF
$182.00 Original price was: $182.00.$103.74Current price is: $103.74.